OptimalPlus Ramp solution is the first true enterprise-level semiconductor characterization solution in the market, suitable for both IDMs and fabless companies.
The growing functionality and complexity of next generation ICs have turned the characterization process into a genuine big data challenge. Whereas, the number of tested parts is relatively small – perhaps only a few thousand – the number of tests can reach tens or even hundreds of thousands of tests-per-part. OptimalPlus NPI eases the collection and management of semiconductor characterization data, providing a full range of product analytics capabilities to comprehensively evaluate and chart the behavior of a new product based on thousands of parametric and functional measurements made across multiple process, voltage and temperature conditions. It enables more product data to be captured, compared and analyzed and drives more actionable insights before production ramp-up begins. This significantly improves the chances of ensuring the creation of a high-quality performance product that is less prone to problems during high-volume production and that subsequently results in fewer RMAs.
Expedite data collection
Increase team collaboration
Fine-tune analysis
Provide accurate reports
See the other suites
Efficiency solution:
Increase throughput
by up to 20%
Yield solution:
Improve overall yield
by up to 2%
Quality solution:
Reduce escapes
by up to 50%
