Semiconductor quality and reliability solutions: manufacture the highest quality products with the lowest defect rates

Establishing a “quality firewall” in manufacturing environments is essential to ensuring the delivery of high-performance semiconductor devices to your customers. Optimal+ Escape Prevention and Outlier Detection deliver the 1-2 punch that combines deterministic and statistical analyses to prevent escapes.  Additionally, parametric SPC, RMA analytics and quality indexing complete the picture, ensuring you prevent bad chips from shipping and enabling you to meet your customers’ zero-defect goals with confidence.

Outlier Detection

Outlier detection has become a standard requirement for many applications. Optimal+ provides the industry’s most comprehensive and powerful library of Outlier Detection algorithms combined with the infrastructure needed to deploy and manage them across distributed manufacturing operations. Our solution can uniquely combine data across multiple operations and use advanced correlation techniques to handle complex scenarios such as using PCA for multi-variate outliers. Advanced packaging solutions where multiple die are assembled into a single package are not a problem as well with our complex genealogy capabilities.

Escape Prevention

Thanks to our broad experience analyzing data from many of the world’s leading semiconductor brands, we have gained insight into a broad range of manufacturing issues that compromise product quality. We translated this knowledge into a library of special rules and algorithms that monitor test operations by identifying a range of equipment-, user- and test-related issues which prevent suspected bad parts from shipping.

Quality Index

Using powerful cross-operational analysis capabilities, Optimal+ can generate unit-level Quality Indexes that enable operations teams to perform highly-sophisticated quality assessment binning by tracking multiple risk factors and device parameter performance across multiple test phases.

RMA Database

The OptimalPlus database provides a way to link detailed information about customer RMAs to existing product information and using our customizable analytics interface enables unprecedented historical analyses. These same analytic capabilities can subsequently be applied to quickly determine the root cause of failure. Both are leveraged to identify abnormalities in the measured performance which can be converted to advanced outlier detection algorithms to prevent future occurrences from reaching the market.

See the other solutions

Ramp solution:
Ramp-up new
products faster

Characterize and ramp new products faster than ever before with the industry’s first collaborative characterization platform, letting you analyze products with multiple IP blocks and huge test programs with ease
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Efficiency solution:
Increase throughput
by up to 20%

Improve manufacturing productivity by identifying and reducing unnecessary tests and retests, increasing machine throughput by up to 20% and creating significant cap-ex and op-ex savings
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Yield solution:
Improve overall yield
by up to 2%

Ensure only truly bad devices are discarded and that all your good devices make it to market, improving overall yield by up to 2%
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“We were able to achieve significant improvements in product yield and quality”
John Docherty, Senior VP, Global Operations, AMD

Explore our knowledge base

Brochures: Solution Overview: Global Ops

Learn how this innovative solution provides an integrated view into your semiconductor products as well as your global manufacturing operations and processes.
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Brochures: Solution overview: Escape Prevention

Download this brochure to learn how you can address the test processes and operational issues that impact quality and lead to test escapes.
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