Semiconductor Efficiency Solutions
Discover and address manufacturing inefficiencies using product analytics and reduce costs by up to 20%. Improve utilization and throughput by identifying and fixing under-performing equipment, achieving higher first-pass yield and reducing unnecessary retest.
Combining key metrics
Our product analytics solutions help you achieve greater equipment utilization, enhance your throughput with greater levels of efficiency and enable better use of your test fleet and global operations while improving your testing processes and products.
Bottom line impact
Lower operational costs by streamlining test operations while reducing your capital expenditure by purchasing less test equipment.
Adaptive Test Time Reduction – ATTR
Optimize test programs without compromising quality. Every semiconductor test facility has a budget for how much time it can dedicate to any given test program, requiring engineers to make difficult decisions about which tests to exclude. OptimalPlus ATTR enables you to increase quality, not reduce it! Rather than just removing a so-called “no-fail” test permanently from a testing program, TTR turns it on/off at designated intervals so that if there is a manufacturing variation, the test is immediately re-introduced.