Optimal+ NPI is the first true enterprise-level semiconductor characterization solution in the market, suitable for both IDMs and fabless companies. 

The growing functionality and complexity of next generation ICs have turned the characterization process into a genuine big data challenge. Whereas, the number of tested parts is relatively small – perhaps only a few thousand – the number of tests can reach tens or even hundreds of thousands of tests-per-part. 

Optimal+ NPI eases the collection and management of semiconductor characterization data, providing a full range of product analytics capabilities to comprehensively evaluate and chart the behavior of a new product based on thousands of parametric and functional measurements made across multiple process, voltage and temperature conditions. 

It enables more product data to be captured, compared and analyzed and drives more actionable insights before production ramp-up begins. This significantly improves the chances of ensuring the creation of a high-quality performance product that is less prone to problems during high-volume production and that subsequently results in fewer RMAs. 

Expedite data collection

Engineers tend to run characterization experiments manually and often. Optimal+ NPI eases the arduous task of collecting, cleansing and annotating unstructured semiconductor characterization data through our “Sandbox” – a one-of-a-kind staging area that facilitates the ETL process: the extraction, transforming and loading of raw characterization data. This both enables the process to become far more efficient and delivers results that are more accurate and complete.

Increase team collaboration

NPI enables semiconductor manufacturers to solve the typical disconnect that exists between characterization teams working on different IP blocks by enabling true transparency and collaboration and driving IIoT connectivity. 

Fine-tune analysis

Optimal+ NPI provides all the capabilities you need to comprehensively analyze and chart the behavior of a new semiconductor device based on parametric and functional measurements across process, voltage and temperature conditions; lot names, product identifiers and much more.

Provide accurate reports

Optimal+ NPI enables quick report generation of all characterization analyses, so that every stakeholder can easily review the detailed results that pertain to their areas of involvement in the project.