At Optimal+, we are leading a paradigm shift from the hit-or-miss approach of current test environments into a next-generation, high-performance solution for manufacturing operations that drives significant improvements in yield, quality and productivity.

We call it Manufacturing Intelligence™, because enabling real-time, intelligent decision-making in manufacturing operations is the prime directive for success in the semiconductor marketplace.

FLAGSHIP SOLUTION

Global Ops

Collect and correlate data from any tester and between every manufacturing facility across your global operations.
Rapidly deliver actionable insights to product team decision makers. Supply chain visibility has never been this clear.

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Complementary Solutions

Test Floor Ops

Test Floor Ops

Efficiency or Quality: Why compromise on one when you can have both? Optimal+ bridges the gap between the tradeoff. It’s the industry’s most innovative solution for ultimate test program management and augmented quality.

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Exact

Exact

Good to go? Not so fast. Optimal+ presents the first solution to take the pass/fail paradigm to the next level: It’s more than just a re-test capability; we ask: Is a “good” device really “good”? And is a “bad” device really “bad”?.

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Test Time Reduction (TTR)

Test Time Reduction (TTR)

Efficiency or Quality: Why compromise on one when you can have both? Optimal+ bridges the gap between the tradeoff. It’s the industry’s most innovative solution for ultimate test program management and augmented quality.

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Escape Prevention

Escape Prevention

Good to go? Not so fast. Optimal+ presents the first solution to take the pass/fail paradigm to the next level: It’s more than just a re-test capability; we ask: Is a “good” device really “good”? And is a “bad” device really “bad”?.

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Outlier Detection

Outlier Detection

Don’t ship your outliers out the door. Optimal+ Outlier Detection captures quality issues within the outlier process and publishes outlier rules to test floors to contain them.

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semiconductor

Sun