• Optimal+ Real-Time Big Data Analytics

  • Big Data Analytics for Semiconductor Manufacturing: Real Value, Real-Time

  • The Voice of the Product - Optimal+ for IIoT

  • Aiming For Zero DPPM in Automotive Electronics, IOT Solutions World Congress 2016, Michael Schuldenfrei, CTO Optimal+

  • CTO BLOG no.4: Smarter Big Data Analytics for Distributed Semiconductor High Volume Manufacturing


  • IoT Solution Conference 2016, Michael Schuldenfrei, CTO


  • NIWeek 2016 - "Breaking Data Silos" , Michael Schuldenfrei, CTO ( Aug. 2016)


  • Securing your supply chain from counterfeit parts through real-time, electronic chip traceability - Symposium on Counterfeit Parts and Materials - June 2016

  • "Preventing Escapes with Big Data", Optimal+ CTO Michael Schuldenfrei

  • "Is the Semiconductor Industry Ready for Big Data?", Optimal+ CTO Michael Schuldenfrei


  • GSA Quality Team Meeting - Dec 2014


  • SEMICON Singapore 2014: Leveraging Test Data to Enhance Quality and Yield for 2.5D/3D Manufacturing - Yaacov De Russo, Optimal+


  • ITC 2013: Escape Prevention and RMA Management - Dan Glotter, Optimal+

  • ITC 2013: OptimalTest Corporate Forum Presentation (Video)

  • ITC 2013: OptimalTest Corporate Forum Demonstration (Video)

  • ITC 2013 OptimalTest Corporate Forum Q&A


  • SEMICON West 2013: TechXPOT - Big Data Breakthroughs in Data Management, Dan Glotter, Optimal+


  • SEMICON Singapore 2013: Breakthrough in Quality Management - Dan Glotter, Optimal+


  • SEMICON West 2013: TestVision 2020 - Escape Prevention & RMA Management, Dan Glotter, Optimal+


  • SEMICON West 2012: Optimal Testing - Data Management for Enhanced Quality, Reliability and Yield Improvement, Dan Glotter, Optimal+


  • ITC 2016, Roberto Lissoni, ST Corporate Quality : “Manufacturing Test Challenges for the IIoT and Automotive Market Segments”

  • ITC 2016, Roberto Lissoni, ST Corporate Quality "Manufacturing Test Challenges For The IIoT And Automotive Market Segments"

  • ITC 2015 : "Improving Quality And Yield", by Marc Jacobs, Marvell


  • ITC 2015 - Marvell Present : "Improving Quality and Yield Through Optimal+ Big Data Analytics".

  • ITC 2014: AMD Corporate Forum Presentation (Video)

  • ITC 2014: AMD Corporate Forum Q&A (Video)


  • ITC 2014: Partnering for Transformation and Margin Improvement - Carl Bowen, Fellow, AMD


  • Taiwan Exec Forum 2013 : Data Mining and Optimization Using Optimal+, Michael Campbell, SVP of Engineering, Qualcomm

  • Taiwan Exec Forum 2013: Optimal+ Collaboration Panel Discussion

  • Taiwan Exec Forum 2013 Qualcomm Presentation

  • ITC 2013: NVIDIA Corporate Forum Presentation Highlights (Video)

  • ITC 2013: NVIDIA Corporate Forum Presentation Full with Q&A (Video)


  • ITC 2013: Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements - Craig Nishizaki, NVIDIA


  • ITC 2012: Broadcom and Optimal+, Gary Eves, Broadcom


  • TUG 2011: Adaptive Testing Techniques - Glenn Plowman, Qualcomm


  • ITC 2011: OptimalEnterprise at Qualcomm - Octavio Martinez, Qualcomm