National Instruments Released its Automated Test Outlook 2016

by David Park | January 28, 2016

National Instruments, a leading provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, released its Automated Test Outlook (ATO) 2016 this week. The annual test and measurement report delivers a comprehensive view of the key trends expected to impact automated test environments and showcases the need for smarter test systems and complimentary solutions.

 

National Instruments invited Optimal+ to discuss the impact that real-time big data solutions are having in the semiconductor industry.  The article, “Harvesting Production Test Data,” discusses how semiconductor companies are using big data solutions to aggregate and analyze terabytes of manufacturing test data and using this data to make proactive impactful business decisions to improve quality, yield and productivity.  To read this article click here, or to download the complete Automated Test Outlook 2016 click here.