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    Your Data is a Gold Mine

    by Michael Schuldenfrei | June 4, 2018
    Companies often face manufacturing problems to which there is no readily apparent solution. When combining parts from different suppliers, both internal and external, how can they maintain the highest level of quality at all stages? Better yet, when quality issues do arise, how can they report them both upstream and downstream? Can they see the manufacturing performance in real time? Or is the data available for analysis only later on in the production process? For each of these questions, companies today need a clear answer. They need highly effective tools geared towards precise predictions and analysis to bring about a […]
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    What Machine Learning can do for Manufacturing

    by Shlomit Tevet | May 15, 2018
    Yield analysis and faulty wafer detection are examples of tasks that would be tedious or impossible to program a computer to do by hand. We’ve designed computer programs that have learned and evolved so they could learn those skills for us. This process is called Machine Learning, and it is changing industries all over the world. Machine Learning is capable of noticing patterns that people miss. Machines can sift through overwhelming amounts of data, and correlate events across time spans and different data sources simply too big for humans to understand. Machine Learning helps organizations manage complexity, change, and uncertainty, and does […]
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    Data Sharing in the Age of Machine Learning Demands a Digital Thread

    by Michael Schuldenfrei | April 22, 2018
    Electronics, and the components that power them, are more complex and advanced than ever. As these technologies become a part of our everyday lives, their quality is more mission-critical than ever. At the pace which the demand for components is increasing, there’s no time for quality to lag behind under pressures to meet demands for quantities. This is a sure-fire way to guarantee a recall at the end of the digital supply chain. According to data from NHTSA, from 2007 to 2016, the automobile industry experienced this very issue when car recalls due to electronics increased threefold. To assure that quality […]
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    Ensuring Effective Big Data Acquisition Improves Product Manufacturing Quality

    by David Park | July 27, 2017
    Recently, Mike Weir, a 20-year veteran of enterprise test automation and Enterprise Data Architect at Optimal+ shared his thoughts on how “Ensuring Effective Big Data Acquisition Improves Product Manufacturing Quality” in EBN.  In this article, Mike discusses the benefits of collecting usable data across disparate supply chains, mapping and harnessing data, and deriving valuable insights from big data that will improve overall manufacturing quality in the semiconductor and electronics industries.  
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    Quality Failure Brings Takata Corporation’s 84 Year History to Bankruptcy

    by David Park | July 19, 2017
    Described by the U.S. National Highway Traffic Safety Administration (NHTSA) as “the most significant safety issue in the history of the United States,” the massive global recall of Takata’s air bag inflators has driven this established Japanese company to declare bankruptcy. This is a cautionary tale with particular relevance today for an industry on the verge of producing autonomous or “self-driving” vehicles that are extremely dependent on electronics quality. As this June 25th Bloomberg article, “Roiled by Airbag Recall Crisis, Takata Files for Bankruptcy” suggests, the commercial exposure goes well beyond Takata. Over the last eight years, the recall requirement […]
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    SEMICON West 2017 is Underway

    by David Park | July 12, 2017
    The biggest exhibition in the US for the semiconductor industry is going on this week at Moscone Center in San Francisco. SEMICON West is underway with many great topics that touch on big data analytics and the growing need for quality management in manufacturing operations. The SMART automotive program has many leaders in the automotive industry presenting on ADAS (Advanced Driver Assistance Systems) including two of our customers: NVIDIA and Qualcomm. SMART manufacturing is another timely topic, discussing traceability across the global supply chain. If you liked this program, you can also hear our Data Scientist, Dan Sebban, talk about […]
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    McKinsey Sees Opportunities Ahead for Fabs that Embrace Big Data Analytics

    by David Park | June 13, 2017
      Semiconductor fabs are under significant pressure to increase efficiencies and get quality products to market in less time. In parallel, they face ever-growing complexities in managing the production environment, which make that goal even harder to achieve. According to a recent McKinsey & Company article: Test and verification times during the design process have shown an industry-wide increase of 50%. The NPI process can involve 12-18 months of debugging before a new product is ready for ramp up. 30% of capital expenditures during assembly and test relate to tests that do not add value – but are nonetheless necessary. […]
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    What we do with IoT analytics is really cool. Just ask Gartner.

    by David Park | June 6, 2017
    It’s not every day that big data analytics for semiconductor and electronics manufacturing gets the cool label. But that’s precisely what Gartner did in recognizing Optimal+ as a Cool Vendor in IoT Analytics for 2017. So what’s so hot about our offering that that we get kudos for being cool? We may be living in the age of the Internet of Things (IoT) but its success ultimately hinges on assuring the Quality of Things (QoT). Bottom line, no one wants an expensive piece of technological wonder that leaves them wondering why they bought it in the first place. With so […]
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    Another Often Overlooked Benefit of Leveraging Big Data in IIoT

    by David Park | June 1, 2017
    It’s all about the product, isn’t it? Corporations large and small are dedicated to manufacturing quality products to satisfy their respective customers. They are also committed to leveraging new technologies and methods that will improve the customer experience and yield. The advent of the Industrial Internet of Things (IIoT) will enable deeper connectivity and information sharing across organizations, and will also provide a positive impact that improves manufacturing processes. However, there is still more to be gained by applying big data analytics to improve individual product quality. With the current IIoT emphasis on process improvements, the need for “product analytics” […]
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    No Company is an Island – CES 2017

    by David Park | January 13, 2017
    Almost 400 years ago, John Donne penned the phrase, “No man is an island, entire of itself…” – words that continue to resonate today. Few would disagree on the need for collaboration, but humans as well as companies can often behave as if it is otherwise. Industry promotions often imply customers need look no further beyond a single entity. The reality is that no company is an island, nor is any solution for that matter; effective solutions and systems (especially in the electronics market segment) do not operate in a vacuum and success is often accomplished by providing a distinctive […]
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