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    No Company is an Island – CES 2017

    by David Park | January 13, 2017
    Almost 400 years ago, John Donne penned the phrase, “No man is an island, entire of itself…” – words that continue to resonate today. Few would disagree on the need for collaboration, but humans as well as companies can often behave as if it is otherwise. Industry promotions often imply customers need look no further beyond a single entity. T […]
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    Going where no one has gone before…

    by David Park | December 11, 2016
    It is perhaps a bit early for the “final frontier” in big data. But there are frontier elements of exploration and discovery that are often hard to articulate in a practical manner amidst the hyperbolic big data claims in the industry. As with other “leading-edge” predictions, a concrete example that provides the contrast of what was before and wha […]
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    NPI for Semiconductor Characterization

    by David Park | November 3, 2016
    The unrelenting pressure for semiconductor manufacturers to get a high quality, competitively priced product tested and to market on time is a continual reality. It is not a static scenario; the need to innovate and update processes is constantly ongoing due to device proliferation and market innovation. Device characterization is an area of proces […]
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    Improving the semiconductor industry through advanced analytics

    by David Park | October 30, 2016
    Recently, an article from global management consulting firm McKinsey & Company, “Improving the semiconductor industry through advanced analytics,” highlighted the benefits and adoption level of advanced analytics in the semiconductor industry – a subject we and our customers are intimately familiar with. McKinsey observes that the adoption leve […]
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    IoT Solutions World Congress (IoTSWC16) Kicks Off Next Week

    by David Park | October 20, 2016
    The 2nd Annual IoT Solutions World Congress (IoTSWC16) begins next Tuesday, Oct. 25 and boasts some of the world’s most influential IoT companies as attendees. More than 8,000 attendees from around the globe will come to IoTSWC16 to learn about the latest IoT solutions trends in six dedicated areas: manufacturing, healthcare, energy and utilities, […]
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    Smarter Big Data Analytics for Distributed Semiconductor High Volume Manufacturing (Video)

    by David Park | September 28, 2016
    Semiconductor companies are racing to compete in the highly competitive IoT era, developing products that will collect and transmit sensor data between objects, animals and people for countless applications.  From a manufacturing perspective, these companies must also excel in the IIoT (Industrial Internet of Things) by aggregating and analyzing te […]
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    Bringing Quality to Electronics Manufacturing

    by David Park | August 2, 2016
    Since our founding, our core mission has been to improve the quality of the semiconductor chip by using in-depth information to better identify problems and to provide insights into global manufacturing operations. After all, the semiconductor is a core element of the electronics’ platform, and its distributed global manufacturing process significa […]
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    Optimal+ Welcomes New Customer Renesas and Hosts 7th Annual SEMICON West Customer Event.

    by David Park | July 13, 2016
    SEMICON West is one of our favorite events.  The event provides an opportunity to connect with our customers, learn more about our industry and share our knowledge with the semiconductor community.  In addition to exhibiting at SEMICON West, Moscone Center, North Hall #6472, we’re hosting our 7th annual customer SEMICON West event at the St. Regis […]
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    Is Big Data The Answer To The Electronics Counterfeiting Problem?

    by David Park | June 8, 2016
    Optimal+ CTO Michael Schuldenfrei spoke at the IEEE International Symposium on Hardware Oriented Security & Trust (HOST) in May to discuss the widespread counterfeiting problem in the electronics industry.  Counterfeiting robs IT manufacturers of up to $5 billion in lost profits according to Industry research from KPMG and the Alliance for Gray […]
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    Xilinx Selects Optimal+ For Real-Time Analytics for Wafer Sort and Final Test Manufacturing Operations

    by David Park | May 31, 2016
    We’re pleased to announce our recent agreement with Xilinx, the world’s leading provider of all programmable FPGAs, SoCs, MPSOCs and 3D ICs.  Xilinx is enabling the next generation of smarter, connected and differentiated systems and networks.   By deploying the Optimal+ Global Ops solution, Xilinx will gain real-time visibility into all production […]
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