Events
Test Vision 2020
Presentation: Adaptive Testing using Machine Learning Who: Dan Sebban, VP of Data Analysis When: Wednesday, July 11 at 1:30 PM - 1:55 PM Where: Test Vision 2020 at SEMICON West will be held at the Moscone Center in San Francisco, CA
San Francisco, CA
What we do
Optimal+ IIoT solutions leverage deep product analytics that measurably improve quality, yield, and productivity for semiconductor and electronics brand owners and their suppliers.
Our enterprise-grade software is used by the most successful companies in these industries to collect, verify and analyze all of their product data to ensure that their products meet all of the quality, reliability and functionality requirements their customers demand.
With over 50 billion chips and boards processed annually, Optimal+ drives true IIoT connectivity, reduces RMAs, and is ushering in an era of robust, long-term quality products.
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Customer Testimonials
Marc Jacobs
VP Engineering Operations
"Escape Prevention from Optimal+ helps enable Marvell to deliver best-in-class silicon solutions for the automotive market segment"
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Customer Testimonials
Michael Campbell
Senior Vice-President of Engineering
"The Optimal+ Escape Prevention Solution enables us to identify specific issues during manufacturing and test that will drive advanced quality screening and comprehensive product management"
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Customer Testimonials
Dr. Albert Wu
VP of Operations
"Escape Prevention from Optimal+ is enabling Marvell to ensure the delivery of exceptional quality devices to the automotive market segment"
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Customer Testimonials
John Docherty
Senior VP, Global Operations
"We were able to achieve significant improvements in product yield and quality"
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Customer Testimonials
Craig Nishizaki
Senior Director of ATE Development
"With Optimal+ we can make very sophisticated real-time decisions that enable us to measurably improve our product quality"
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Customer Testimonials
Carl Bowen
AMD Fellow
"We went from we can’t afford to do this [Optimal+]" to "We can’t afford not to do this [Optimal"
